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Industrial Solution Guide - Crystal growing - Czochralski process

Your advantages:
  • Special calibration for silicon (Si) enables very high measuring accuracy at the working temperature
  • established solution for temperature measurement of the Czochralski process
  • exact alignment by means of integrated video camera or through-the-lens sighting

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Ewing, NJ 08638 USA
Telephone: 609-443-5522

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