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Pyrometer CellaCrystal PX 44

Article description

The CellaCrystal PX 44 has been developed for optical temperature measurement in the production of Si and SiC crystals. The calibration is especially adapted to the growth process. Because of the hybrid signal evaluation with a constantly high resolution of < 0.1 K over the entire measuring range and the very high long-term stability thanks to the uniform light sensor technology, this device meets the high demands on the required measuring accuracy.

Special features:
  • Measuring range 750 to 3
  • 000 °C -- PX 44 AF 4: special calibration for the production of crystals of silicon -- PX 44 AF 4: special calibration for the production of silicon carbide -- hybrid signal evaluation for high metrological resolution -- high long-term stability due to minimal self-heating -- focusable lens for exact adjustment of the measuring distance -- standard feature: IO-LINK interface and analogue output

Pyrometer CellaCrystal PX 44
Measuring range
Focal range
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More information about IO-Link:

Version CellaCrystal PX 44 AF 4 
Version CellaCrystal PX 40 AF 7 
Measuring range 750 - 2400 °C 
Measuring range 850 - 3000 °C 
Focal range 0,4 m - ∞ 
Focal range 0,4 m - ∞ 
Shape of the measuring field round 
Distance ratio 150 : 1 
Distance ratio 150 : 1 
Objective PZ 20.01 
Objective PZ 20.01 
Measuring principle two-color 
Sighting option Through-the-lens sighting 
Sighting option Laser pilot light 
Sighting option Video camera 

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